Low Cost Optical Modeling Software by Junonia Photonics
Program FILM
Program FILM models multilayer thin film stacks on a substrate. Input and output is via text on screen, files on disk, and presentation quality graphics. It calculates many optical properties including reflectance, transmittance, electric and magnetic fields, the Poynting vector, and optical rotation and ellipticity. Materials are characterized by their refractive index or dielectric tensor, so optically active and birefringent materials can also be modeled. There is a small library of the wavelength-dependent optical properties of various materials and the user can easily add more.
The multilayer thin film algorithm is described in detail in Fundamental Optical Models which can be purchased at Amazon, Barnes & Noble, or Routledge.
Modeling Examples:*
Polarized reflectance and transmittance as a function of polar angle of incidence for a simple, one layer thin film.
Polarized reflectance and transmittance as a function of polar angle of incidence for a surface plasmon mode on a thin gold film.
Polarized reflectance and transmittance as a function of polar angle of incidence for a simple, birefringent material at several different azimuthal angles.
Magneto-optics and Poynting vector of thin film stack.
Reflectance and transmittance at normal incidence for a quarter-wave reflecting film stack.
Reflectance and transmittance at normal incidence for a quarter-wave reflecting film stack with a center defect.
Polarized reflectance as a function of polar angle for a nematic liquid crystal on a plasmonic silver film.
Spectral reflectance calculated for 187±18 nm blue chitin scale lamina and 120±15 nm gold scale lamina of the Junonia butterfly. After R. C. Thayer et al., eLife 9:e52187 (April 7, 2020).
*Note: all plots are generated using commercial graphics software from the text data output of the program though presentation quality graphics on the screen are also generated by the program.