Low Cost Optical Modeling Software by Junonia Photonics
Program FILM: calculates the optical properties of multilayer planar thin films on a substrate including reflectance, transmittance, electric and magnetic fields, optical rotation and ellipticity, and the Poynting vector.
Program GRATING: calculates the optical properties of multilayer conformal thin films on a diffraction grating substrate including reflectance, transmittance, and electric and magnetic fields for all diffracted orders.
Program PLANAR: calculates the planar waveguide properties of multilayer planar thin films on a substrate including mode indices, and electric and magnetic fields.
Program MOL: calculates the optical properties of general waveguides such as rib and strip waveguides including mode indices, and electric and magnetic fields. Calculates overlap integrals with focused spots.
Program FOCUS: calculates the full vector electric and magnetic fields, and Poynting vector in the vicinity of the focal plane of an astigmatic lens for uniform illumination and Gaussian illumination, and for incident linear, elliptical, radial and azimuthal polarizations. File output can be used in the waveguide programs for calculating the coupling efficiency via overlap integrals.
Program MIE: calculates the optical cross sections and the electric and magnetic fields for an incident plane wave scattering from a sphere surrounded by multiple concentric shells.
Program FIBER: calculates the mode indices and electric and magnetic fields for optical fiber with multiple concentric shells around the core. Also calculates the mode overlap for an incident focused field, and the far field from a fiber truncated at slant angle. The wavelength-dependent refractive indices for multiple materials are available, and the user can easily add additional material files.
All programs come with free priority mail shipping.