Low Cost Optical Modeling Software by Junonia Photonics
Program GRATING
Program GRATING models multilayer conformal thin film stacks on a diffraction grating. All input and output is via text on screen or files on disk. It calculates various optical properties including reflectance and transmittance of the diffracted orders as a function of polar and azimuthal angles of incidence, and the electric and magnetic fields through the film stack. Materials are characterized by their scalar refractive index. The program follows the method of Chandezon which is described in detail in the accompanying 74 page manual. It is particularly useful for sinusoidal gratings. It can also handle skewed and tilted gratings and some trapezoidal gratings, but is not suitable for square gratings.
$100
Currently shipping only within U.S.
Modeling Examples:*
Polarized reflectance from gold film on grating as a function of polar angle of incidence exhibiting a surface plasmon resonance.
Polarization conversion from p to s in the reflected zero order from surface plasmon excitation as a function of azimuthal angle of incidence.
s- and p-polarized reflectance for p-polarized incident beam as a function of polar angle of incidence exhibiting both plasmon and waveguide resonant modes.
s-polarized reflectance as a function of polar angle of incidence exhibiting the excitation of a waveguide mode in a multilayer dielectric thin film stack on a grating.
Multilayer reflector film stack as a function of layer thicknesses for high reflectance of the p-polarization in a Littrow mount grating.
Interference image on tracking detector for light focused onto the back side of an aluminized CD exhibiting surface plasmon resonances.
Grating period and groove depth optimization for grating-to-waveguide coupler.
Electric field of -1st diffracted order within the grating film stack.
*Note: all plots are generated using commercial graphics software from the text data output of the program.